Netlist Extraction & Cross-probing
Neals strongly supports LSI failure analysis by extracting netlist from
the layout, and by cross-probing the generated circuit logic with the layout.
- Extraction of the netlist from the layout enables failure analysis of LSI
with no circuit data remaining.
- Clear view of the circuit arrangement allows you to check the connection of circuits easier than checking form the netlist.
- Cross-probing function makes failure analysis easier, reducing the turnaround time and the human errors.
Cross-Probe of Circuit Logic and Layout
Neals cross-probing function highlights the equivalent points of circuit
logic and layout.
Cross-probing of each layer is possible, making it easier to analyze.
Neals can cross-probe from equipotential lines and VIA. It highlights the connected cell and circuit, making failure analysis easier and more efficient.
|OS||Red Hat Enterprise Linux Version4, Version5|